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Improvement of Jc-B characteristics in biaxially aligned Y-Ba-Cu-O thin films on metallic substrate

✍ Scribed by O. Kohno; Y. Iijima; K. Onabe; N. Futaki; N. Sadakata; N. Tanabe; Y. Ikeno


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
651 KB
Volume
1
Category
Article
ISSN
0964-1807

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✦ Synopsis


Biaxially aligned (triaxially aligned) YSZ thin films were formed on polycrystalline substrates by ionbeam assisted deposition (IBAD). The biaxial aligning of YSZ was much affected by the incident angle of the assisting ion-beam toward the substrate. In-plane aligned YBCO thin films were deposited by laser ablation on polycrystalline substrates, Hastelloy alloy, with biaxially aligned YSZ thin films as the buffer layers. Jc-B characteristics of these YBCO thin films were improved in one order of magnitude, compared with ones buffered with conventionally sputtered YSZ, and high Jc values of 105 A/cm2 (77K, OT) range stable for many times were obtained. The small mis-orientation angles at grain boundaries of in-plane aligned YBCO thin film along a-and b-axes were observed by TKM.


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