Improvement of hot-carrier resistance and radiation hardness of nMOSFETs by irradiation-then-anneal treatments

✍ Scribed by Kuei-Shu Chang-Liao; Jenn-Gwo Hwu

• Book ID: 103393605
• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 296 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90015-q