Improvement of hot-carrier and radiation hardnesses in metal-oxide-nitride-oxide semiconductor devices by irradiation-then-anneal treatments

✍ Scribed by Kuei-Shu Chang-Liao; Jenn-Gwo Hwu

• Book ID: 114535678
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 314 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.278518