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Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure

✍ Scribed by Wei Cao; Yao, C.J.; Jiao, G.F.; Daming Huang; Yu, H.Y.; Ming-Fu Li

Book ID: 114620499
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 628 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2144987

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