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Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions

โœ Scribed by Constance E. Schuster; Mark G. Vangel; Harry A. Schafft


Book ID
108361803
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
190 KB
Volume
41
Category
Article
ISSN
0026-2714

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