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Improved analysis of the intermodulation performance of ferroelectric thin-film and bulk-based varactors

✍ Scribed by Muhammad Taher Abuelma’atti

Book ID
113060673
Publisher
Springer
Year
2011
Tongue
English
Weight
323 KB
Volume
71
Category
Article
ISSN
0925-1030

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## Abstract A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is