𝔖 Bobbio Scriptorium

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Improve resolution of industrial x-ray computed tomographic 3D images: 40845 Jacquemod, G.; Odet, C.; Peyrin, F.; Goutte, R. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands) 23–28 Apr. 1989, Vol. 1, pp. 74–79. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989

Publisher: Elsevier Science
Year: 1990
Weight: 323 KB
Volume: 23
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(90)92204-e

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