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Important defect aspects in optoelectronic applications of Si- and SiGe/Si-heterostructures

✍ Scribed by W.M. Chen; I.A. Buyanova; A. Henry; W.-X. Ni; G.V. Hansson; B. Monemar

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 313 KB
Volume: 102
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(96)00064-5

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