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Impedance spectroscopy study of anodic growth of zirconium oxide film in NaOH medium

✍ Scribed by Pauporté, T. ;Finne, J. ;Lincot, D.

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
130 KB
Volume
202
Category
Article
ISSN
0031-8965

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✦ Synopsis

Abstract

The growth of anodic oxide films on zirconium metal has been followed up to 300 V by electrochemical impedance spectroscopy and scanning electron microscopy. The maximum layer thickness is 720 nm, the dielectric constant of the film is measured at 19.5 and the growth constant is 2.4 nm V^–1^. Above 50 V, the presence of two impedance relaxations between 1 Hz and 200 kHz reveals a bilayered structure. This may be a consequence of a lower resistivity of the outer layer induced by some electrolytic solution infiltration into film defects. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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