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Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics

✍ Scribed by K. Martens; W. Wang; K. De Keersmaecker; G. Borghs; G. Groeseneken; H. Maes

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 888 KB
Volume: 84
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2007.04.039

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