Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs

✍ Scribed by S.N. Ong; K.S. Yeo; K.W.J. Chew; L.H.K. Chan; X.S. Loo; C.C. Boon; M.A. Do

• Book ID: 113916139
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 256 KB
• Volume: 72
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2012.02.008