This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-off
β¦ LIBER β¦
Impact of thermal effect on reliability in Optical Network-on-Chip
β Scribed by Li, Hui; Gu, Huaxi; Yang, Yintang; Zhu, Zhangming
- Book ID
- 120077835
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 547 KB
- Volume
- 124
- Category
- Article
- ISSN
- 0030-4026
No coin nor oath required. For personal study only.
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