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Impact of the starting interstitial oxygen concentration on the electrical characteristics of electron irradiated Si junction diodes

✍ Scribed by E. Simoen; J.P. Dubuc; J. Vanhellemont; C. Claeys


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
331 KB
Volume
36
Category
Article
ISSN
0921-5107

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