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Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological Node

✍ Scribed by Raine, Mélanie; Hubert, Guillaume; Gaillardin, Marc; Artola, Laurent; Paillet, Philippe; Girard, Sylvain; Sauvestre, Jean-Etienne; Bournel, Arnaud

Book ID: 119950468
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 805 KB
Volume: 58
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2011.2109966

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