Impact of the free electron distribution on the random telegraph signal capture kinetics in submicron n-metal–oxide–semiconductor field-effect transistors

✍ Scribed by Lukyanchikova, N. B.; Petrichuk, M. V.; Garbar, N. P.; Simoen, E.; Claeys, C.

• Book ID: 120510125
• Publisher: American Institute of Physics
• Year: 1998
• Tongue: English
• Weight: 312 KB
• Volume: 73
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.122476