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Impact of scaling on the DC/RF thermal behavior of SiGe HBTs for high-frequency applications

✍ Scribed by Grazia Sasso; Vincenzo d’Alessandro; Maurizio Costagliola; Salvatore Russo; Niccolò Rinaldi

Book ID
116760356
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
637 KB
Volume
177
Category
Article
ISSN
0921-5107

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