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[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Impact of high frequency correlated noise on SiGe HBT low noise amplifier design

✍ Scribed by Shen, Pei; Niu, Guofu; Xu, Ziyan; Zhang, Wanrong

Book ID: 120686726
Publisher: IEEE
Year: 2012
Weight: 157 KB
Category: Article
ISBN: 1457713160
DOI: 10.1109/SiRF.2012.6160163

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