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Impact of Random Interface Traps and Random Dopants in High-$k$ /Metal Gate Junctionless FETs

✍ Scribed by Wang, Yijiao; Huang, Peng; Wei, Kangliang; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Zhang, Xing; Kang, Jinfeng

Book ID: 126745976
Publisher: IEEE
Year: 2014
Tongue: English
Weight: 718 KB
Volume: 13
Category: Article
ISSN: 1536-125X
DOI: 10.1109/TNANO.2014.2312482

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