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Impact of Random Fabrication Errors on Fundamental Forward-Wave Small-Signal Gain and Bandwidth in Traveling-Wave Tubes With Finite-Space-Charge Electron Beams

✍ Scribed by Sengele, Sean; Barsanti, Marc L.; Hargreaves, Thomas A.; Armstrong, Carter M.; Booske, John H.; Lau, Y. Y.

No coin nor oath required. For personal study only.

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