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[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Effects of random circuit fabrication errors on the mean and standard deviation of small signal gain and phase in a traveling wave tube

✍ Scribed by Rittersdorf, Ian M.; Antonsen, Thomas M.; Chernin, David; Lau, Y. Y.

Book ID: 120669219
Publisher: IEEE
Year: 2013
Weight: 756 KB
Category: Article
ISBN: 1467359769
DOI: 10.1109/IVEC.2013.6571002

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