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Impact of Process Induced Defects on the Contact Characteristics of Ti∕Graphene Devices

✍ Scribed by Liu, W. J.; Yu, H. Y.; Wei, J.; Li, M. F.

Book ID: 121341304
Publisher: The Electrochemical Society
Year: 2011
Tongue: English
Weight: 192 KB
Volume: 14
Category: Article
ISSN: 1099-0062
DOI: 10.1149/2.014112esl

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