✦ LIBER ✦
Effect of sputter-etching conditions on the barrier characteristics and the process-induced defects in (Ti-W)/Si Schottky diodes
✍ Scribed by D. Bauza; C. Mallardeau; Y. Morand
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 384 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0921-5107
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