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Impact of parasitic thermal effects on thermoelectric property measurements by Harman method

โœ Scribed by Kwon, Beomjin; Baek, Seung-Hyub; Keun Kim, Seong; Kim, Jin-Sang


Book ID
126592729
Publisher
American Institute of Physics
Year
2014
Tongue
English
Weight
924 KB
Volume
85
Category
Article
ISSN
0034-6748

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