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Impact of Oxide Thickness on Gate Capacitance—A Comprehensive Analysis on MOSFET, Nanowire FET, and CNTFET Devices

✍ Scribed by Sinha, Sanjeet Kumar; Chaudhury, Saurabh

Book ID: 120975621
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 573 KB
Volume: 12
Category: Article
ISSN: 1536-125X
DOI: 10.1109/TNANO.2013.2278021

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