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[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi, India (2012.12.7-2012.12.9)] 2012 Annual IEEE India Conference (INDICON) - Oxide thickness effect on quantum capacitance in single-gate MOSFET and CNTFET devices

✍ Scribed by Sinha, Sanjeet Kumar; Chaudhury, Saurabh

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