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Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers

✍ Scribed by D. Macdonald

Publisher
Springer
Year
2005
Tongue
English
Weight
581 KB
Volume
81
Category
Article
ISSN
1432-0630

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## Abstract We review recent results relating to the boron–oxygen defect in compensated crystalline silicon for solar cells. The experimental observations are not easily explained by the standard model for the boron–oxygen defect, which involves substitutional boron. In addition, the proposed prese