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Impact of native oxides beneath the gate contact of AlGaN/GaN HFET devices

✍ Scribed by D. Mistele; O. Katz; A. Horn; G. Bahir; J. Salzman

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
291 KB
Volume
2
Category
Article
ISSN
1862-6351

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