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Impact of MOSFET Gate-Oxide Reliability on CMOS Operational Amplifier in a 130-nm Low-Voltage Process

✍ Scribed by Ming-Dou Ker, ; Jung-Sheng Chen,

Book ID: 120446490
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 632 KB
Volume: 8
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2008.922016

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