✦ LIBER ✦
The Impact of Gate-Oxide Breakdown on Common-Source Amplifiers With Diode-Connected Active Load in Low-Voltage CMOS Processes
✍ Scribed by Jung-Sheng Chen; Ming-Dou Ker
- Book ID
- 114618947
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 438 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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