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Impact of measurement uncertainties on universal scaling of MHD turbulence

✍ Scribed by G. Gogoberidze; S. C. Chapman; B. Hnat; M. W. Dunlop

Book ID
117947943
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
235 KB
Volume
426
Category
Article
ISSN
0035-8711

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✍ J. Allam; A. R. Adams πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 255 KB

We have investigated impact ionization in semiconductors under hydrostatic pressure p, by measuring the avalanche breakdown voltage V b in InAs, Si, GaAs and Ge. The sign of dV b adp was determined by the dominant phonon scattering mechanism (polar or intervalley phonons). A quantitative comparison