Impact of low gamma radiation dose on electrical trap related effects in AlGaN/GaN HEMTs

✍ Scribed by Piccione, M.; Berthet, F.; Boudart, B.; Trolet, J.L.; Guhel, Y.; Gaquière, C.; Gualous, H.

• Book ID: 125520300
• Publisher: The Institution of Electrical Engineers
• Year: 2012
• Tongue: English
• Weight: 246 KB
• Volume: 48
• Category: Article
• ISSN: 0013-5194
• DOI: 10.1049/el.2012.1966