Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence

✍ Scribed by F. Berthet; Y. Guhel; H. Gualous; B. Boudart; J.L. Trolet; M. Piccione; C. Gaquière

• Book ID: 119326746
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 825 KB
• Volume: 52
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2012.07.007