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Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence

✍ Scribed by F. Berthet; Y. Guhel; H. Gualous; B. Boudart; J.L. Trolet; M. Piccione; C. Gaquière


Book ID
119326746
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
825 KB
Volume
52
Category
Article
ISSN
0026-2714

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