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Impact of ion energy on single-event upset

✍ Scribed by Dodd, P.E.; Musseau, O.; Shaneyfelt, M.R.; Sexton, F.W.; D'hose, C.; Hash, G.L.; Martinez, M.; Loemker, R.A.; Leray, J.-L.; Winokur, P.S.

Book ID: 115523362
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 945 KB
Volume: 45
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.736489

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