Impact of Edge Encroachment on Programming and Erasing Gate Current in nand -Type Flash Memory

✍ Scribed by Ji-Ting Liang; Chun-Hsing Shih; Wei Chang; Yan-Xiang Luo; Ming-Kun Huang; Nguyen Dang Chien; Wen-Fa Wu; Sau-Mou Wu; Chenhsin Lien; Shirota, R.; Chiu-Tsung Huang; Su Lu; Wang, A.

• Book ID: 114620372
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 792 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2105492