Impact of carrier injection in 2.2 nm-thick SiO2 oxides after first and substrate enhanced electron injection

✍ Scribed by Céline Trapes; Didier Goguenheim; Alain Bravaix

• Book ID: 117146504
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 263 KB
• Volume: 322
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(03)00202-3