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Impact of 100 MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy

✍ Scribed by A. Kanjilal; J. Lundsgaard Hansen; A. Nylandsted Larsen; D. Kanjilal

Book ID: 108279382
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 212 KB
Volume: 600
Category: Article
ISSN: 0039-6028
DOI: 10.1016/j.susc.2006.06.002

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