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Imaging of photonic nanopatterns by scanning near-field optical microscopy

✍ Scribed by Maas, H. J.; Naber, A.; Fuchs, H.; Fischer, U. C.; Weeber, J. C.; Dereux, A.

Book ID
115396658
Publisher
Optical Society of America
Year
2002
Tongue
English
Weight
359 KB
Volume
19
Category
Article
ISSN
0740-3224

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## Abstract This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few