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Image registration in electron microscopy: Application of a robust method

✍ Scribed by Bonnet, No�l ;Liehn, Jean-Claude

Publisher
Wiley (John Wiley & Sons)
Year
1988
Tongue
English
Weight
631 KB
Volume
10
Category
Article
ISSN
0741-0581

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✦ Synopsis

The geometric registration of two electron microscopic images generally is performed by maximizing the cross-correlation coefficient between them. We show that a new similarity measure (the number of sign changes) is useful for performing simultaneously geometric and gray-level registration. This method is robust, which means that it provides a good estimation of the parameters even in the presence of outliers that cannot be described by the registration model.

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