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Image properties in an aberration-corrected photoemission electron microscope

✍ Scribed by R. Könenkamp; T. Jones; J. Elstner; R. Word; G. Rempfer; T. Dixon; L. Almaraz; W. Skoczylas

Publisher: Elsevier
Year: 2008
Tongue: English
Weight: 698 KB
Volume: 1
Category: Article
ISSN: 1875-3892
DOI: 10.1016/j.phpro.2008.07.132

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