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Amplitude Contrast — A Way to Obtain Directly Interpretable High-Resolution Images in a Spherical Aberration Corrected Transmission Electron Microscope

✍ Scribed by Foschepoth, M. ;Kohl, H.


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
504 KB
Volume
166
Category
Article
ISSN
0031-8965

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