๐”– Bobbio Scriptorium
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Image intensity matching technique: Application to the environmental scanning electron microscope

โœ Scribed by Xi, Yunping; Bergstrom, Todd B.; Jennings, Hamlin M.


Book ID
121921976
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
966 KB
Volume
2
Category
Article
ISSN
0927-0256

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Environmental scanning electron microsco
โœ Scott A. Wight; Cynthia J. Zeissler ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 613 KB

## Abstract This work provides examples of some of the imaging capabilities of environmental scanning electron microscopy applied to easily charged samples relevant to particle analysis. Environmental SEM (also referred to as high pressure or low vacuum SEM) can address uncoated samples that are kn