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Application of the Kossel X-ray technique for obtaining crystallographic data in the scanning electron microscope

✍ Scribed by D.J. Dingley; G. Ferran

Publisher: Elsevier Science
Year: 1977
Weight: 431 KB
Volume: 8
Category: Article
ISSN: 0047-7206
DOI: 10.1016/0047-7206(77)90019-x

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