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Image calculation of a tilted contamination deposit for the thickness measurement of a TEM foil

✍ Scribed by Sawai, T.; Suzuki, M.

Book ID
122484548
Publisher
Elsevier Science
Year
1990
Weight
320 KB
Volume
24
Category
Article
ISSN
0956-716X

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## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Γ… is presented. This method is based on the observation of Kossel‐MΓΆllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐MΓΆllenstedt method in electron diff