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[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Independent-gate four-terminal FinFET SRAM for drastic leakage current reduction

✍ Scribed by Kazuhiko Endo, ; Shin-ichi O'uchi, ; Yuki Ishikawa, ; Yongxun Liu, ; Takashi Matsukawa, ; Kunihiro Sakamoto, ; Meishoku Masahara, ; Junichi Tsukada, ; Kenichi Ishii, ; Hiromi Yamauchi, ; Eiichi Suzuki,

Book ID: 121183379
Publisher: IEEE
Year: 2008
Weight: 1007 KB
Category: Article
ISBN: 1424418100
DOI: 10.1109/ICICDT.2008.4567247

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