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[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Temperature-based phase change memory model for pulsing scheme assessment

✍ Scribed by Yi-Bo Liao, ; Jun-Tin Lin, ; Meng-Hsueh Chiang,

No coin nor oath required. For personal study only.

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