𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2004 - Brussels, Belgium (10-12 May 2004)] 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the - Finite element modelling of crack detection tests

✍ Scribed by Ridout, S.; Dusek, M.; Bailey, C.; Hunt, C.

Book ID: 121730196
Publisher: IEEE
Year: 2004
Weight: 864 KB
Category: Article
ISBN-13: 9780780384200
DOI: 10.1109/ESIME.2004.1304033

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