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[IEEE The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems - Las Vegas, NV, USA (1-4 June 2004)] The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems (IEEE Cat. No.04CH37543) - Thermal modeling of self-heating in strained-silicon MOSFETs

✍ Scribed by Wenjun Liu, ; Asheghi, M.

Book ID: 125435212
Publisher: IEEE
Year: 2004
Weight: 328 KB
Category: Article
ISBN-13: 9780780383579
DOI: 10.1109/itherm.2004.1318340

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