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[IEEE The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems - Las Vegas, NV, USA (1-4 June 2004)] The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems (IEEE Cat. No.04CH37543) - Electrothermal models of transistors based on finite element analysis for radar applications

✍ Scribed by Raphael, S.; Christophe, C.; Philippe, D.; Raymond, Q.

Book ID: 121200730
Publisher: IEEE
Year: 2004
Weight: 590 KB
Category: Article
ISBN-13: 9780780383579
DOI: 10.1109/ITHERM.2004.1318327

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