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[IEEE The 16th International Conference on Microelectronics, 2004. ICM 2004. - Tunis, Tunisia (Dec. 6-8, 2004)] Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. - The use of extracted BSIM3v3 MOS parameters for fast design of circuits on weak inversion

✍ Scribed by de Carvalho Ferreira, L.H.; Pimenta, T.C.

Book ID: 120032269
Publisher: IEEE
Year: 2004
Weight: 557 KB
Category: Article
ISBN-13: 9780780386563
DOI: 10.1109/ICM.2004.1434212

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