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[IEEE The 16th International Conference on Microelectronics, 2004. ICM 2004. - Tunis, Tunisia (Dec. 6-8, 2004)] Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. - On the degradation of organic field-effect transistors

✍ Scribed by Pannemann, Ch.; Diekmann, T.; Hilleringmann, U.

Book ID: 121086834
Publisher: IEEE
Year: 2004
Weight: 646 KB
Category: Article
ISBN-13: 9780780386563
DOI: 10.1109/ICM.2004.1434210

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